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This tech note describes considerations in thermal applications for Micron memory devices, including thermal impedance, thermal resistance, junction temperature, operating temperature, memory reliability, reliability modeling, device reliability, and high-temperature electronics.

This document describes how to calculate the write amplification factor (WAF) for Micron's M500 family of personal storage SSDs.

This document describes how to run the ATA SECURITY ERASE command on Micron SATA SSDs using the Linux utility Parted Magic.

Explanation of Micron packaging labels and procedures.

Describes the benefits of controlling ESD in the workplace, including higher yields and improved quality and reliability, resulting in reduced manufacturing costs.